Atomic Force Microscopy (AFM)


Model: Edge3

Atomic force microscope is a scanning force microscope that provides high resolution imaging. The scan area may range from 100 microns to several nanometers according to the specimen. At AFM, high-resolution surface topography is achieved by recording interactions between the specimen surface and a specimen that has a radius of curvature on several nanometer scale mounted on a cantilever. AFM provides spatial information both parallel and perpendicular to the surface. Different scanning modes (contact, non-contact, tapping, etc.) are used depending on the sample and the characteristic to be analyzed. It also provides information on the electrical and magnetic properties of the sample using appropriate tips. By analyzing the sample-tip interaction as well as high-resolution topographical information, it enables research on properties such as adhesion and hardness.

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