Scanning Electron Microscope (SEM)


Model: Quanta FEG 250

A Scanning Electron Microscope is a device that provides high-resolution images at high magnifications. The sample inlet compartment consists of 5 basic parts: electron source, detectors, vacuum system, imaging and data processing unit. Surface morphology analysis, cross-sectional microstructure analysis, powder characterization, point elemental analysis, linear elemental analysis, area elemental analysis and elemental mapping can be performed by taking electron signal images under high or low vacuum conditions. ETD, STEM, EDS, LFD and GSED detectors and the Peltier Stage module used to detect phase changes.

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