X-Ray Fluorescence Spectrometer (XRF)


Model: Xepos II

X-Ray Fluorescence (XRF) spectroscopy allows the determination of elemental composition. The rays (photons) emerging from the X-ray source are sent to the sample to be analyzed chemically. Photons interacting with their atoms, for example, if they have sufficient kinetic energy, remove an electron from the inner shell of the atom and bring the atom from the basic state to a higher energy level. When excited electrons return to their initial energy levels, they return the energy which they have gained as the secondary x-rays called energy-induced fluorescence emission. The wavelengths of these characteristic rays are fixed, and it is the characteristic of the element, which for example allows the analysis of the chemical.

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