X-Ray Diffraction (XRD)


Model: D8 Advance

X-ray diffraction (XRD) is a method which is used to study the atomic and molecular structure of crystal. In principle, it is based on the diffraction of the rays of an X-ray beam to the crystal in various specific directions. In the measurement of X-ray diffraction, while the crystals placed on an angle meter was slowly rotating, rays resulting in the bombardment of X-rays form a diffraction pattern arranged at regular intervals known as reflections. In the qualitative analyzes after the X-ray diffraction patterns of the samples are obtained, the phases can be determined by comparing with the data in the system library.

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